Affiliation:
1. Department of Information Engineering and Mathematics University of Siena Siena Italy
2. Department of Information Engineering University of Florence Firenze Italy
Abstract
AbstractThe article shows that transient chaos phenomena can be observed in a generalized memristor Chua's circuit where a nonlinear resistor is introduced to better model the real memristor behaviour. The flux‐charge analysis method is used to explain the origin of transient chaos, that is attributed to the drift of the index of the memristor circuit invariant manifolds caused by the charge flowing into the nonlinear resistor.
Funder
Ministero dell'Università e della Ricerca
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Cited by
1 articles.
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