Loss distribution measurement of silica-based waveguides by using a jaggedness-free optical low coherence reflectometer
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19940986?crawler=true&mimetype=application/pdf
Reference10 articles.
1. Ultrahigh-sensitivity low coherence otdr using Er1+-doped high-power superfluorescent fibre source
2. Measurement of Rayleigh backscattering at 1.55 mu m with 32 mu m spatial resolution
3. High-sensitivity low coherence reflectometer using erbium-doped superfluorescent fibre source and erbium-doped power amplifier
4. Characterization of silica-based waveguides with an interferometric optical time-domain reflectometry system using a 13-μm-wavelength superluminescent diode
5. Polarization-independent interferometric optical-time-domain reflectometer
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1. Low-Driving-Voltage Electro-Optic Modulator With Novel KTa1-xNbxO3Crystal Waveguides;Japanese Journal of Applied Physics;2004-08-25
2. Optical low-coherence reflectometry using a Gaussian bandpass filter for measuring WDM components;IEEE Photonics Technology Letters;1999-08
3. Noise in optical low-coherence reflectometry;IEEE Journal of Quantum Electronics;1998-07
4. Measurement of depolarization ratio and ultimate limit of polarization crosstalk in silica-based waveguides by using a POLCR;Journal of Lightwave Technology;1998-04
5. Optical low coherence reflectometer with a 47-dB dynamic range achieved by using a fluoride-based erbium-doped fiber amplifier;Journal of Lightwave Technology;1998-04
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