Barrier height enhancement of Au Schottky junctions on phosphine-plasma treated n-AlInAs
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19940213?crawler=true&mimetype=application/pdf
Reference13 articles.
1. Schottky-barrier height of In0.43Al0.57As
2. Schottky barrier height of InxAl1−xAs epitaxial and strained layers
3. Schottky barrier heights of n-type and p-type Al/sub 0.48/In/sub 0.52/As
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Characterization of AlInAs/InGaAs High Electron Mobility Transistor Wafers Treated with Remote Phosphine Plasma;Japanese Journal of Applied Physics;2002-02-28
2. Improvement of Dark Current Density of AlInAs/InGaAs Metal-Semiconductor-Metal Photodetector Using Phosphine-Plasma-Treated Schottky Barrier;Japanese Journal of Applied Physics;1996-03-15
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