Reliability studies on GaAs MESFETs fabricated using spin-on platinum source-Reference-Cited by-同舟云学术

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Reliability studies on GaAs MESFETs fabricated using spin-on platinum source

Published:1994-03-17 Issue:6 Volume:30 Page:528-529
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:

Author:

Prasad K.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_19940351?crawler=true&mimetype=application/pdf

Reference5 articles.

1. Annual Reliability and Maintainbility Symp., an annual publication by the IEEE Reliability Society

2. Howes, M.J., Morgan, D.V., ‘Reliability and degradation’, (Wiley USA 1981)

3. Williams, R.: ‘Modern GaAs processing methods’, 2nd Edn.(Artech House USA 1990)

4. Fabrication of platinum and ruthenium Schottky contacts to n-GaAs using spin-on sources

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