AI safety of film capacitors

Author:

Zhang Yong‐Xin1,Chen Fang‐Yi2,Liu Di‐Fan1,Wang Jian‐Xiao3ORCID,Feng Qi‐Kun1,Jiang Hai‐Yang14,Wang Xin‐Jie1,Zhao Hong‐Bo5,Zhong Shao‐Long1ORCID,Shah Faisal Mehmood6,Dang Zhi‐Min1ORCID

Affiliation:

1. Department of Electrical Engineering Tsinghua University Beijing China

2. Department of Electrical and Computer Engineering Carnegie Mellon University Pittsburgh Pennsylvania USA

3. National Engineering Laboratory for Big Data Analysis and Applications Peking University Beijing China

4. Harvard John A. Paulson School of Engineering and Applied Sciences Harvard University Cambridge Massachusetts USA

5. Department of Energy Technology Aalborg University Aalborg Denmark

6. Department of Electrical Electronic Telecommunication Engineering and Naval Architecture University of Genoa Genova Italy

Abstract

AbstractWith a large number of film capacitors being deployed in critical locations in electrical and electronic systems, artificial intelligence (AI) technology is also expected to address the problems encountered in this process. According to our findings, AI applications can cover the entire lifecycle of film capacitors. However, the AI safety hazards in these applications have not received the attention they deserve. To meet this, the authors argue, with specific examples, risks that flawed, erratic, and unethical AI can introduce in the design, operation, and evaluation of film capacitors. Human‐AI common impact and more multi‐dimensional evaluation for AI are proposed to better cope with unknown, ambiguity, and known risks brought from AI in film capacitors now and in the future.

Funder

National Key Research and Development Program of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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