Novel stationary-sample atomic force microscope with beam-tracking lens
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19930181?crawler=true&mimetype=application/pdf
Reference10 articles.
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Tip-Scanning HS-AFM;High-Speed Atomic Force Microscopy in Biology;2022
2. A Mini Review of the Key Components used for the Development of High-Speed Atomic Force Microscopy;Science of Advanced Materials;2017-01-01
3. Novel Three-Dimensional Beam Tracking System for Stationary-Sample-Type Atomic Force Microscopy;IEEE Transactions on Instrumentation and Measurement;2006-10
4. A novel design of a constant volume electrochemical cell for atomic force microscopy measurements;Electroanalysis;1995-03
5. Effect of raised temperature on a stainless-steel surface by ambient atomic-force microscopy;Proceedings, annual meeting, Electron Microscopy Society of America;1993-08-01
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