Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances-Reference-Cited by-同舟云学术

Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances

Published:2007-09-01 Issue:5 Volume:1 Page:240-244
ISSN:1751-8822
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:

Author:

Chahine I.,Mazari B.,Kadi M.,Gaboriaud E.,Gallenne X.,Louis A.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://digital-library.theiet.org/content/journals/10.1049/iet-smt_20060142?crawler=true&mimetype=application/pdf

Reference10 articles.

1. ‘Integrated circuits – measurement of electromagnetic immunity 150 kHz to 1 GHz – Part 4: Direct RF power injection method’, February, 2006 p. 8–9

2. Bendhia, S., Ramdani, M., and Sicard, E.: ‘Electromagnetic compatibility of integrated circuits, techniques for low emission and susceptibility’, (Springer 2006), p. 145–146 276, 360–361, 370–371

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