Author:
Cho S.-H.,Joo S.-K.,Kwon S.-H.,Jang G.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics
Reference13 articles.
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2. Voltage and lamp flicker issues: should the IEEE adopt the IEC approach?
3. A microprocessor-based digital flickermeter
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