NHD‐YOLO: Improved YOLOv8 using optimized neck and head for product surface defect detection with data augmentation

Author:

Chen Faquan123ORCID,Deng Miaolei34,Gao Hui13,Yang Xiaoya5,Zhang Dexian34

Affiliation:

1. School of Mechanical and Electrical Engineering Henan University of Technology Zhengzhou China

2. School of Industrial Software Henan University of Engineering Zhengzhou China

3. Henan International Joint Laboratory of Grain Information Processing Zhengzhou China

4. School of Information Science and Engineering Henan University of Technology Zhengzhou China

5. College of Artificial Intelligence Beijing University of Posts and Telecommunications Beijing China

Abstract

AbstractSurface defect detection is an essential task for ensuring the quality of products. Many excellent object detectors have been employed to detect surface defects in resent years, which has achieved outstanding success. To further improve the detection performance, a defect detector based on state‐of‐the‐art YOLOv8, named improved YOLOv8 by neck, head and data (NHD‐YOLO), is proposed. Specifically, YOLOv8 from three crucial aspects including neck, head and data is improved. First, a shortcut feature pyramid network is designed to effectively fuse features from backbone by improving the information transmission. Then, an adaptive decoupled head is proposed to alleviate the feature spatial misalignment between the classification and regression tasks. Finally, to enhance the training on small objects, a data augmentation method named selective small object copy and paste is proposed. Extensive experiments are conducted on three real‐world datasets: detection dataset from Northeastern University (NEU‐DET), printed circuit boards from Peking University (PKU‐Market‐PCB) and common objects in context (COCO). According to the results, NHD‐YOLO achieves the highest detection accuracy and exhibits outstanding inference speed and generalisation performance.

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

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