Lifetime estimation and diagnosis of XLPE used in HV insulation cables under thermal ageing: arithmetic sequences optimised by genetic algorithms approach

Author:

Bessissa Lakhdar12,Boukezzi Larbi1,Mahi Djillali2,Boubakeur Ahmed3

Affiliation:

1. Materials Science and Informatics Laboratory, MSILUniversity Ziane Achour of DjelfaBP 3117 route of MoudjbaraDjelfa17000Algeria

2. Laboratory of Studies and Development of Semiconductor and Dielectric Materials, LeDMaScDUniversity Amar Telidji of LaghouatBP 37G route of GhardaïaLaghouat03000Algeria

3. L.R.E./Laboratory of High VoltageEcole Nationale PolytechniqueEL‐Harrah 16200AlgiersAlgeria

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Control and Systems Engineering

Reference23 articles.

1. Toledo T.: ‘Calculating electrical stress in the insulations establishing non linear semiconductor materials’. PhD thesis Central School of Lyon France 2004(in French)

2. Sato T. Muraki K. Sato N.et al.: ‘Recent technical trends of 500 kV XLPE cable’ IEEE 3rd International conference on Power Cable and Accessories 10kV‐500 kV London UK November 1993 pp.59–63

3. Development of 500-kV XLPE cables

4. 500 kV aluminium‐sheathed XLPE cable in 96 m vertical shaft;Osozawa K.;IEEE Power Eng. Soc. Winter Meeting,2000

5. Gross L.H. Furno J.S. Reid C.G.et al.: ‘XLPE materials for extruded high/extra‐high voltage transmission cables’.IEEE Conf. Record of International Symp. on Electrical Insulation Arlington VA USA June 7–101998 pp.538–542

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3