Reliability and performance of optimised Schmitt trigger gates-Reference-Cited by-同舟云学术

Reliability and performance of optimised Schmitt trigger gates

Published:2018-08 Issue:8 Volume:2018 Page:735-744
ISSN:2051-3305
Container-title:The Journal of Engineering
language:en
Short-container-title:J. eng.

Author:

Tache Mihai¹²,Ibrahim Walid³,Kharbash Fekri³,Beiu Valeriu¹

Affiliation:

1. Department of Mathematics and Computer ScienceFaculty of Exact SciencesAurel Vlaicu University of AradRomania

2. University Politehnica of BucharestRomania

3. Department of Computer and Network EngineeringCollege of Information TechnologyUnited Arab Emirates UniversityUnited Arab Emirates

Funder

United Arab Emirates University

Semiconductor Research Corporation

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering,Energy Engineering and Power Technology,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2018.0091

Reference73 articles.

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5. Intl. Tech. Roadmap for Semiconductors (ITRS) 2.0 SEMATECH Albany NY USA 2015. Available athttp://www.itrs2.net/

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