Improved bare PCB defect detection approach based on deep feature learning
Author:
Affiliation:
1. Electronic Information School, Wuhan UniversityWuhanPeople's Republic of China
2. Key Laboratory of Machine Perception, Peking UniversityShenzhenPeople's Republic of China
3. INRIA Grenoble Rhône‐AlpesSaint IsmierFrance
Publisher
Institution of Engineering and Technology (IET)
Subject
General Engineering,Energy Engineering and Power Technology,Software
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2018.8275
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