Electrical Derivative Measurement of High‐Power InGaAs LDs Under Scanning Current with Variable Step-Reference-Cited by-同舟云学术

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Electrical Derivative Measurement of High‐Power InGaAs LDs Under Scanning Current with Variable Step

Published:2017-05 Issue:3 Volume:26 Page:508-513
ISSN:1022-4653
Container-title:Chinese Journal of Electronics
language:en
Short-container-title:Chin. j. electron.

Author:

Tao Min¹,Guan Jian¹,Gao Fengli¹,Gao Liangli²,Cao Junsheng³

Affiliation:

1. State Key Laboratory on Integrated OptoelectronicsCollege of Electronic Science and EngineeringJilin UniversityChangchun130012China

2. The 27th Research InstituteChina Electronics Technology Group CorporationZhengzhou450047China

3. Changchun Institute of OpticsFine Mechanics and PhysicsChinese Academy of SciencesChangchun130031China

Publisher

Institution of Engineering and Technology (IET)

Subject

Applied Mathematics,Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/cje.2017.03.006

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