Electro-optic sampling using an external GaAs probe tip

Author:

Shinagawa M.,Nagatsuma T.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Reference6 articles.

1. Valdmanis, J.A., and Pei, S.S.: ‘A non-contact electro-optic prober for high speed integrated circuits’, Picosecond electronics and optoelectronics II, (Springer-Verlag, New York 1987), p. 4–10

2. Whitaker, J.F., Valdmanis, J.A., Jackson, T.A., Bhasin, K.B., Romanofsky, R., and Mourou, G.A.: ‘External electro-optic probing of millimeter-wave integrated circuits’, IEEE MTT-S Digest, 1989), p. 221–224

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