Bayes‐TDG: effective test data generation using Bayesian belief network: toward failure‐detection effectiveness and maximum coverage-Reference-Cited by-同舟云学术

Bayes‐TDG: effective test data generation using Bayesian belief network: toward failure‐detection effectiveness and maximum coverage

Published:2018-06 Issue:3 Volume:12 Page:225-235
ISSN:1751-8806
Container-title:IET Software
language:en
Short-container-title:IET softw.

Author:

Feyzi Farid¹,Parsa Saeed¹

Affiliation:

1. School of Computer Engineering Iran University of Science and technology Tehran Iran

Publisher

Institution of Engineering and Technology (IET)

Subject

Computer Graphics and Computer-Aided Design

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-sen.2017.0112

Reference49 articles.

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4. Zhang J. Chen X. Wang X.: ‘Path-oriented test data generation using symbolic execution and constraint solving techniques’.Proc. Second Int. Conf. IEEE Software Engineering and Formal Methods 2004 SEFM 2004 2004 pp.242–250

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