Soft error rates in 64 K and 256 K DRAMs
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19860814?crawler=true&mimetype=application/pdf
Reference6 articles.
1. Owen, D.: ‘Models for charge collection from alpha particle plasmas in silicon’, 1984, MSc dissertation, South Bank Polytechnic
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Evaluation of high density DRAMs as a nuclear radiation detector;Applied Radiation and Isotopes;1997-10
2. Neutron detection using soft errors in dynamic Random Access Memories;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1994-09
3. Total dose radiation effects on DRAM performance;International Journal of Electronics;1994-05
4. Neutron dosimetry employing soft errors in dynamic random access memories;Physics in Medicine and Biology;1989-09-01
5. Energy deposition in small cylindrical targets by ultrasoft X-rays;Physics in Medicine and Biology;1989-06-01
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