Author:
Rabakavi Basavaraj,Siddamal Saroja V
Subject
Management of Technology and Innovation,Physics and Astronomy (miscellaneous),Engineering (miscellaneous)
Reference20 articles.
1. B. Rabakavi, Saroja Siddamal, "Design of High Speed, Reconfigurable Multiple ICs Tester using FPGA Platform", IEEE, ICEECCOT, 909-914, December, 2018. https://doi.org/10.1109/ICEECCOT43722.2018.9001588.
2. M. S. Zaghloul and M. Saleh, "Implementation of FPGA for decision making in portable automatic testing systems for ICs library & Digital Circuits ," IEEE Applied Imagery Pattern Recongnition Workshop, 2011. https://doi.org/10.1109/AIPR.2011.6176361.
3. B. Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert van Rijsinge, "Trends in Testing Integrated Circuits", International Test Conference, IEEE, 2004. https://doi.org/ 10.1109/TEST.2004.1387330.
4. I.A. Grout , Integrated Circuit Test Engineering: Modern Techniques, Springer, 2006.
5. M.L. Bushnell, Vishwani D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Kluwer Academic Publishers, 2002.
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