Abstract
The Laue diffraction theory of X-ray microbeams in multilayers
(MLs) has been developed. The solution for calculating Xray
reciprocal space maps has been obtained. The pendulum
(Pendellösung) effect for perfect and imperfect MLs has been
demonstrated. The numerical simulation of Laue diffraction in
Mo/Si multilayers with boundary conditions in the case of geometrical
optics and the Fresnel approximation has been carried
out. For X-ray microbeams, the scattering at the edges
of collimators and slits of the diffractometer should be taken
into account.
Subject
General Earth and Planetary Sciences,General Energy