Author:
Ieshkin A.E.,Nazarov A.V.,Bessmertny Danila,Kutlusurin Ilias,Shemukhin Andrey
Reference42 articles.
1. Ion beam tools for nondestructive in-situ and in-operando composition analysis and modification of materials at the Tandem Laboratory in Uppsala;P Str�m;J. Instrum,2022
2. Thin film depth profiling by ion beam analysis;C Jeynes;Analyst,2016
3. Surface ripples induced by gas cluster ion beam on copper surface at elevated temperatures;A Ieshkin;Mater. Lett,2020
4. A perspective on nanoscale pattern formation at surfaces by ionbeam irradiation;R Cuerno;J. Appl. Phys,2020