Sparse Domain Robust Denoising Pipeline in Optically-Sectioned Structured Illumination Microscopy for Complex Surface Measurement

Author:

Chai Changchun,Chen Cheng,Qu Tong,Liu XiaoJun

Publisher

Elsevier BV

Reference52 articles.

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2. Applications of super-resolution imaging in the field of surface topography measurement;R Leach;Surface Topography: Metrology and Properties,2013

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4. Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy;Z Xie;Opt Express,2018

5. Wide-field profiling of smooth steep surfaces by structured illumination;H Wang;Optics Communications,2016

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