A New X-Ray Beam Induced Current Setup, Coupled with X-Ray Diffraction Imaging, for Diamonds and Semiconductors Characterization by Synchrotron Techniques at Esrf-Reference-Cited by-同舟云学术

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A New X-Ray Beam Induced Current Setup, Coupled with X-Ray Diffraction Imaging, for Diamonds and Semiconductors Characterization by Synchrotron Techniques at Esrf

Published:2023 Issue: Volume: Page:
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Author:

Lafont Fabien,Baruchel José,Bousquet Jessica,Capria Ennio,Celestre Rafael,Cotte Marine,Dauvergne Denis,Everaere Pierre,Gallin-Martel Marie-Laure,Hoarau Christophe,Ibourk Oussama,Letellier Juliette,Molle Robin,Muraz Jean-Francois,Nusimovici Dov,Reynaud Melvyn,Tran-Caliste Thu Nhi

Publisher

Elsevier BV

Reference20 articles.

1. X-ray beam induced current analysis of CVD diamond detectors in the perspective of a beam tagging hodoscope development for hadrontherapy on-line monitoring;M.-L Gallin-Martel;Diamond and Related Materials,2021

2. Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications;T N Tran Thi;J. Appl. Cryst,2017

3. Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals;L Kirste;Materials,2022

4. Defect characterization and numerical modelling of single-crystal ultra-pure intrinsic diamond;S Mohapatra;Diamond and Related Materials,2020

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