Correlation Coefficient Filtering Algorithm in White Light Interferometry

Author:

Duan JingXuan,Yao Na,Jiao Jiao

Publisher

Elsevier BV

Reference15 articles.

1. A White-Light Interferometry for the Measurement of High-Finesse Fiber Optic EFPI Sensors;Z Wang;IEEE Photonics Technol. Lett,2014

2. Five-step phase-shifting white-light interferometry for the measurement of fiber optic extrinsic Fabry-Perot interferometers;H Gao;Appl. Opt,2018

3. Measurement of thin film interfacial surface roughness by coherence scanning interferometry;H Yoshino;J. Appl. Phys,2017

4. Measurement of Transparent Film Using Vertical Scanning White-Light Interferometry;S P Chang;J. Phys. Conf. Ser,2006

5. Sub surface damage measurements based on short coherent interferometry;M Sergeeva;J. Eur. Opt. Soc. Rapid Publ,2010

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