Analysis of Metal and Zinc Oxide Semiconductor Interface Resistance Using Transmission Line Method
Author:
Publisher
Elsevier BV
Reference19 articles.
1. Obtaining the specific contact resistance from transmission line model measurements;G K Reeves;IEEE Electron device letters,1982
2. Investigation of Low-Resistance Metal Contacts on p-Type GaN Using the Linear and Circular Transmission Line Method;A Weimar;physica status solidi (a),2001
3. Investigation on Contact Resistance of Amorphous Indium Gallium Zinc Oxide Thin Film Transistors with Various Electrodes by Transmission Line Method;Sang Lee;Transactions on Electrical and Electronic Materials,2015
4. Characteristics of electrical metal contact to monolayer WSe2;Dae Jung;Thin Solid Films,2021
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