Increasing Signal to Noise Ratio of Large Pinhole STED Imaging Using Differential Detection-Reference-Cited by-同舟云学术

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Increasing Signal to Noise Ratio of Large Pinhole STED Imaging Using Differential Detection

Published:2023 Issue: Volume: Page:
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Author:

Wei Tongda,Zhang Yunhai,Ji Lin,Yang Haomin

Publisher

Elsevier BV

Reference19 articles.

1. Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy;S W Hell;Optics letters,1994

2. Subdiffraction resolution in far-field fluorescence microscopy;T A Klar;Optics letters,1999

3. Saturated patterned excitation microscopya concept for optical resolution improvement;R Heintzmann;JOSA A,2002

4. Nonlinear structured-illumination microscopy: wide-field fluorescence imaging with theoretically unlimited resolution;M Gustafsson;Proceedings of the National Academy of Sciences,2005

5. Imaging intracellular fluorescent proteins at nanometer resolution;E Betzig;Science,2006

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