Author:
Tempelaere A.,Van Doorselaer L.,He J.,Verboven P.,Nicolaï B.
Publisher
International Society for Horticultural Science (ISHS)
Cited by
1 articles.
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1. Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging;2023 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW);2023-10-02