Interface Migration in Metals (IMM):“Vingt Ans Après” (Twenty Years Later)
Author:
Affiliation:
1. Institut für Metallkunde und Metallphysik, RWTH Aachen, 52056 Aachen, Germany
2. Institute of Solid State Physics, Russian Academy of Science, Chernogolovka, Moscow Distr., Russia
Abstract
Publisher
Walter de Gruyter GmbH
Subject
Materials Chemistry,Metals and Alloys,Physical and Theoretical Chemistry,Condensed Matter Physics
Link
https://www.degruyter.com/document/doi/10.3139/146.110077/pdf
Reference140 articles.
1. An X-ray device for continuous tracking of moving interfaces in crystalline solids
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