Structural and Electrical Properties of Copper Sulfide (CuS) Thin Films doped with Mercury and Nickel impurities
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Published:2014
Issue:5
Volume:6
Page:28-31
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ISSN:2278-4861
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Container-title:IOSR Journal of Applied Physics
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language:
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Short-container-title:IOSRJAP
Author:
Osuwa J. C, ,Mgbaja E. C
Cited by
4 articles.
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