The study of semiconductor layer effect on underground cables with Time Domain Reflectometry (TDR)
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Published:2013
Issue:6
Volume:7
Page:01-07
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ISSN:2320-3331
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Container-title:IOSR Journal of Electrical and Electronics Engineering
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language:
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Short-container-title:IOSR-JEEE
Cited by
5 articles.
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