New way to overcome on the mirror effect for imaging the surface of insulator-Reference-Cited by-同舟云学术

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New way to overcome on the mirror effect for imaging the surface of insulator

Published:2014 Issue:6 Volume:6 Page:12-20
ISSN:2278-4861
Container-title:IOSR Journal of Applied Physics
language:
Short-container-title:IOSRJAP

Author:

Zoory Muayyed Jabar,

Publisher

IOSR Journals

Subject

General Medicine

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Calculating the effective trapped charges on the dielectric sample surface;THE 9TH INTERNATIONAL CONFERENCE ON APPLIED SCIENCE AND TECHNOLOGY (ICAST 2021);2022

2. Analysis of the Focusing Ion Beam Microscope Ion Mirror Method for Studying Influence of the Measuring Chamber;Journal of Physics: Conference Series;2021-07-01

3. Influence of Sample and Ion Beam potential on the Mirror Effect phenomenon at Low accelerated Voltage;IOP Conference Series: Materials Science and Engineering;2018-12-17

4. Study a scanning beam current in focusing ion beam device of overcome mirror effect;Optik;2018-04

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