Center Symmetric Local Descriptors for Image Classification
Author:
Affiliation:
1. Indian Institute of Technology (Indian School of Mines), Dhanbad, India
2. University of California, Los Angeles, USA
Abstract
Publisher
IGI Global
Reference26 articles.
1. Improving Local Binary Patterns Techniques by Using Edge Information
2. Face Description with Local Binary Patterns: Application to Face Recognition
3. Bhateja, V., Kalsi, A., & Srivastava, A. (2015). Image similarity metric (ISIM): a reduced reference image quality assessment approach. CSI transactions on ICT, 3(1), 1-11.
4. XGBoost
5. Feature description based on center-symmetric local mapped patterns
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