Model-Based Testing of Embedded Systems Exemplified for the Automotive Domain

Abstract

The purpose of this chapter is to introduce the test methods applied for embedded systems addressing selected problems in the automotive domain. Model-based test approaches are reviewed and categorized. Weak points are identified and a novel test method is proposed. It is called model-in-the-loop for embedded system test (MiLEST) and is realized in MATLAB®/Simulink®/Stateflow® environment. Its main contribution refers to functional black-box testing based on the system and test models. It is contrasted with the test methods currently applied in the industry that form dedicated solutions, usually specialized in a concrete testing context. The developed signal-feature-oriented paradigm developed herewith allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows and allows for a systematic and automatic test data selection. Processing of both discrete and continuous signals is possible, so that the hybrid behavior of embedded systems can be handled.