1. Allen, R. D., David, G. B., & Nomarski, G. (1969). The Zeiss-Nomarski differential equipment for transmitted light microscopy.
2. Phase Modulation Microscope MIM-2.1 for Measurements of Surface Microrelief. General Principles of Design and Operation
3. Bennett, A. H., Jupnik, H., Osterberg, H., & Richards, O. W. (1951). Phase microscopy. Principles and Applications. New York: John Wiley & Sons, Inc.; London: Chapman & Hall, Ltd.
4. Brandon, D., & Kaplan, W. D. (1999). Microstructural characterization of materials. Chichester, West Sussex, UK: JohnWiley & Sons Ltd.