Topographic Diagnosis of Craniopharyngiomas: The Accuracy of MRI Findings Observed on Conventional T1 and T2 Images
Author:
Publisher
American Society of Neuroradiology (ASNR)
Subject
Clinical Neurology,Radiology Nuclear Medicine and imaging
Reference14 articles.
1. Intraventricular craniopharyngiomas: topographical classification and surgical approach selection based on an extensive overview;Pascual;Acta Neurochir (Wien),2004
2. Topographic Diagnosis of Papillary Craniopharyngiomas: The Need for an Accurate MRI-Surgical Correlation
3. Craniopharyngioma Classification
4. Infundibulo-tuberal or not strictly intraventricular craniopharyngioma: evidence for a major topographical category
5. Craniopharyngioma adherence: a comprehensive topographical categorization and outcome-related risk stratification model based on the methodical examination of 500 tumors
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1. Prognostic Impact of Hypothalamic Perforation in Adult Patients With Craniopharyngioma: A Cohort Study;The Journal of Clinical Endocrinology & Metabolism;2024-01-30
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3. The Role of Tumor-Associated Hypothalamic Involvement in Surgical Treatment and Long-Term Outcome in Adult Patients with Craniopharyngioma;World Neurosurgery;2023-12
4. Pediatric craniopharyngiomas: magnetic resonance imaging assessment for hypothalamus-pituitary axis dysfunction and outcome prediction;Pediatric Radiology;2023-11-29
5. Characteristics and factors influencing hypothalamic pituitary dysfunction in patients with craniopharyngioma;Frontiers in Endocrinology;2023-06-02
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