Wavelets for Self-Calibration of Aerial Metric Camera Systems

Abstract

In this paper, wavelets are applied to develop new models for the self-calibration of aerial metric camera systems. It is well known and mathematically proven that additional parameters (APs) can compensate image distortions and remaining error sources by a rigorous photogrammetric bundle-block adjustment. Thus, kernel functions based on orthogonal wavelets (e. g., asymmetric Daubechies wave- lets, least asymmetric Daubechies wavelets, Battle-Lemarié wavelets, Meyer wavelets) are used to build the wavelets-based family of APs for self-calibrating digital frame cameras. These new APs are called wavelet APs. Its applications in rigorous tests are accomplished by using aerial images taken by an airborne digital mapping camera in situ and practical calibrations. The test results demonstrate that these orthogonal wavelet APs are applicable and largely avoid the risk of over-parameterization. Their external accuracy is evaluated using reliable and high precision check points in the calibration field.