1. Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University and the School of Electronic and Information Engineering, Nanjing University of Information Science and Technology
2. School of Electronic and Information Engineering, Nanjing University of Information Science and Technology
3. e Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University
4. Jiangsu Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University