Adversarial Metric Learning

Author:

Chen Shuo1,Gong Chen23,Yang Jian134,Li Xiang14,Wei Yang14,Li Jun34

Affiliation:

1. School of Computer Science & Engineering, Nanjing University of Science & Technology

2. School of Computer Science & Engineering, Nanjing University of Science

3. Key Laboratory of Intelligent Perception & Systems for High-Dimensional Information

4. Jiangsu Key Laboratory of Image & Video Understanding for Social Security

Abstract

In the past decades, intensive efforts have been put to design various loss functions and metric forms for metric learning problem. These improvements have shown promising results when the test data is similar to the training data. However, the trained models often fail to produce reliable distances on the ambiguous test pairs due to the different samplings between training set and test set. To address this problem, the Adversarial Metric Learning (AML) is proposed in this paper, which automatically generates adversarial pairs to remedy the sampling bias and facilitate robust metric learning. Specifically, AML consists of two adversarial stages, i.e. confusion and distinguishment. In confusion stage, the ambiguous but critical adversarial data pairs are adaptively generated to mislead the learned metric. In distinguishment stage, a metric is exhaustively learned to try its best to distinguish both adversarial pairs and original training pairs. Thanks to the challenges posed by the confusion stage in such competing process, the AML model is able to grasp plentiful difficult knowledge that has not been contained by the original training pairs, so the discriminability of AML can be significantly improved. The entire model is formulated into optimization framework, of which the global convergence is theoretically proved. The experimental results on toy data and practical datasets clearly demonstrate the superiority of AML to representative state-of-the-art metric learning models.

Publisher

International Joint Conferences on Artificial Intelligence Organization

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