Feature extraction using sequential cumulative bin and overlap mean intensity for iris classification
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Published:2018-11-29
Issue:6
Volume:26
Page:2887-2900
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ISSN:1300-0632
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Container-title:TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES
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language:
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Short-container-title:Turk J Elec Eng & Comp Sci
Author:
ALI Ahmad Nazri,SUANDI Shahrel Azmin,ABDULLAH Mohd Zaid
Publisher
The Scientific and Technological Research Council of Turkey (TUBITAK-ULAKBIM)
Subject
Electrical and Electronic Engineering,General Computer Science
Cited by
1 articles.
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