Improving the drain-current expression of BSIM4 for hot-carrier degradation modeling that is suitable for analog applications
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Published:2015
Issue:
Volume:23
Page:2215-2224
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ISSN:1300-0632
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Container-title:TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES
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language:
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Short-container-title:Turk J Elec Eng & Comp Sci
Publisher
The Scientific and Technological Research Council of Turkey (TUBITAK-ULAKBIM)
Subject
Electrical and Electronic Engineering,General Computer Science