Development of microfluidic flow cytometry capable of characterization of single-cell intrinsic structural and electrical parameters

Author:

Liang Hongyan,Zhang Yi,Chen Deyong,Li Yueying,Wang Yixiang,Wang Junbo,Chen JianORCID

Abstract

Abstract Although single-cell intrinsic structural and electrical parameters (e.g. D c of cell diameter, D n of nuclear diameter, σ cy of cytoplasmic conductivity and C sm of specific membrane capacitance) are promising for cell-type classification, they cannot be obtained simultaneously due to structural limitations of previously reported flow cytometry. This paper presented a microfluidic flow cytometry made of a double T-type constriction channel plus a predefined fluorescence detection domain, capable of high-throughput characterizing single-cell D c, D n, σ cy and C sm leveraging a home-developed impedance-fluorescence model. As a demonstration, the microfluidic platform quantified D c, D n, σ cy and C sm from ∼10 000 individual cells of three well-established tumor cell lines of A549, SW620 and HeLa where successful rates of cell-type classification were estimated as 54.5 ± 1.3% (D c), 68.9 ± 6.8% (D c + D n) and 84.8 ± 4.4% (D c, D n, σ cy + C sm) based on neural pattern recognition. Then D c, D n, σ cy and C sm derived from ∼10 000 single cells of K562 vs Jurkat of leukemia and SACC-LM vs CAL 27 of oral tumor were quantified and compared, where successful rates of cell-type classification were estimated as 87.3% (K562 vs Jurkat) and 79.5% (SACC-LM vs CAL 27), respectively. In summary, the microfluidic platform reported in this study could quantify single-cell intrinsic structural and electrical parameters simultaneously, leading to significant increases in successful rates of cell-type classification.

Funder

Key Project of Chinese Academy of Sciences

Instrument Research and Development of Chinese Academy of Sciences

Youth Innovation Promotion Association of the Chinese Academy of Sciences

National Natural Science Foundation of China

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Electronic, Optical and Magnetic Materials

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