Optical reflectance studies of highly specular anisotropic nanoporous (111) InP membrane-Reference-Cited by-同舟云学术

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Optical reflectance studies of highly specular anisotropic nanoporous (111) InP membrane

Published:2015-03-05 Issue:4 Volume:30 Page:044003
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Steele J A,Lewis R A,Sirbu L,Enachi M,Tiginyanu I M,Skuratov V A

Funder

Australian Research Council

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0268-1242/30/i=4/a=044003/pdf

Reference18 articles.

1. Porous Semiconductors

2. Formation and application of porous silicon

3. Porous Silicon—A Versatile Host Material

4. Investigation of Fermi-level pinning at silicon/porous-silicon interface by vibrating capacitor and surface photovoltage measurements

5. Gas sensor applications of porous Si layers

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Gold Electroplating as a Tool for Assessing the Conductivity of InP Nanostructures Fabricated by Anodic Etching of Crystalline Substrates;Journal of The Electrochemical Society;2017

2. Anomalous retroreflection from nanoporous materials as backscattering by ‘dark’ and ‘bright’ modes;Journal of Optics;2016-11-22

3. Characterization and chemical surface texturization of bulk ZnTe crystals grown by temperature gradient solution growth;International Journal of Minerals, Metallurgy, and Materials;2015-07

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