Mechanical and structural characterization of atomic layer deposition-based ZnO films-Reference-Cited by-同舟云学术

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Mechanical and structural characterization of atomic layer deposition-based ZnO films

Published:2011-10-12 Issue:11 Volume:26 Page:115005
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Tapily K,Gu D,Baumgart H,Namkoong G,Stegall D,Elmustafa A A

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Extremely low temperature growth of ZnO by atomic layer deposition

2. ZnO/CdS/CuInSe2thin‐film solar cells with improved performance

3. Growth and Characterization of Sparsely Dispersed ZnO Nanowires

4. Electrical Properties of Zn(Mn,Co)O Films Grown by Pulsed Laser Deposition Method

5. Pulsed Laser Deposited ZnO for Thin Film Transistor Applications

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4. Cathodoluminescence and structural properties of ZnTe nanocrystals synthesized from Te/ZnO thin films;Journal of Alloys and Compounds;2023-10

5. Improvement of Mechanical Characteristics on Ultra-High Molecular Weight Polyethylene Surface through Zinc Oxide Atomic Layer Deposition Film;Advances in Materials Science and Engineering;2022-12-13

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