Far-infrared optically detected cyclotron resonance in GaAs layers and low-dimensional structures-Reference-Cited by-同舟云学术

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Far-infrared optically detected cyclotron resonance in GaAs layers and low-dimensional structures

Published:1992-03-01 Issue:3 Volume:7 Page:357-363
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Ahmed N,Agool I R,Wright M G,Mitchell K,Koohian A,Adams S J A,Pidgeon C R,Cavenett B C,Stanley C R,Kean A H

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0268-1242/7/i=3/a=014/pdf

Reference19 articles.

1. Optical detection of cyclotron resonance in GaP and ZnTe

2. Optically detected magnetic resonance (O.D.M.R.) investigations of recombination processes in semiconductors

3. Optically detected cyclotron resonance in a GaAs/Ga0.67Al0.33As superlattice

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1. Fundamentals of EPR Related Methods;Magnetic Resonance of Semiconductors and Their Nanostructures;2017

2. Optically detected far-infrared cyclotron resonance of two-dimensional electrons in a single GaAs/(Al,Ga)As heterojunction;Physical Review B;2013-02-25

3. Cyclotron Resonance;Characterization of Materials;2012-05-18

4. Sensitivity of a VCSEL threshold performance to inaccuracies in its manufacturing;Opto-Electronics Review;2010-01-01

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