Automatic evaluation of optical constants and thickness of thin films: application to thin dielectric layers
Author:
Publisher
IOP Publishing
Subject
Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/0335-7368/7/i=6/a=301/pdf
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1. Contr le et r alisation de rev tements multidi lectriques pr sentant des caract ristiques spectrales impos es
2. Méthode de calcul des constantes optiques des couches minces absorbantes à partir de mesures de réflexion et de transmission
3. Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness
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1. Optical characterization of a homogenous photosensitive layer by thin film resonance method;Optical Engineering;2005-03-01
2. Accurate computation of the Briot–Sellmeier and Briot–Cauchy chromatic dispersion coefficients from the transmittance spectrum of thin films of arbitrary absorptance;Journal of the Optical Society of America A;2002-08-01
3. Artificial anisotropy and polarizing filters;Applied Optics;2002-06-01
4. Methods for Determining Optical Parameters of Thin Films;Handbook of Optical Constants of Solids;1998
5. Methods for Determining Optical Parameters of Thin Films;Handbook of Optical Constants of Solids;1997
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