Speckle-pattern interferometry to determine object deformations
Author:
Publisher
IOP Publishing
Subject
Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/0335-7368/4/i=5/a=303/pdf
Reference9 articles.
1. Recording of In-plane Surface Displacement by Double-exposure Speckle Photography
2. Displacement Measurement from Double-exposure Laser Photographs
3. A double exposure technique for speckle pattern interferometry
4. Application of Speckling for In-plane Vibration Analysis
5. Analysis of Mechanical Oscillations by Speckling
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Thermal expansion coefficient measurement by double-exposure speckle photography;Optics Communications;1993-11
2. Power spectrum determination of a random pattern: comparison between numerical and analogic processing methods;Journal of Optics;1978-03
3. Atmospheric turbulent layers localisation by optical processing of stellar shadow pattern;Nouvelle Revue d'Optique;1975-01
4. Information processing using speckle patterns;Topics in Applied Physics;1975
5. Information Processing Using Speckle Patterns;Topics in Applied Physics;1975
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