Abstract
Abstract
Dark-field x-ray imaging (DFXI) is a technology that can obtain information related to the small-angle x-ray scattering of a sample. In this paper, we report on the quantification of the dark-field effects by measuring the real space correlation function of scattering samples in a single-shot grid-based x-ray imaging setup that enables a simple approach to DFXI. The experimental measurements of the dark-field effects in our imaging setup were in good agreement with the theoretical quantification over the entire range of test conditions, thus verifying its effectiveness for single-shot grid-based DFXI. Consequently, we were able to clearly understand the associated particle-scale selectivity, which can help us determine suitable applications for single-shot grid-based x-ray DFXI.
Funder
Korea Medical Device Development Fund grant funded by the Korea government
Korea Institute of Energy Technology Evaluation and Planning(KETEP) and the Ministry of Trade, Industry & Energy(MOTIE) of the Republic of Korea
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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