Abstract
Abstract
Modern nanotechnology demands advanced microscopy with ever finer resolution and detectivity of both explicit and inexplicit features of matter. While typical optical microscopy can only directly observe the diffraction-limited appearance of a sample, a plethora of novel techniques has been presented to interrogate the intrinsic nature of matter in super-resolution. In particular, photo-induced force microscopy (PiFM) has attracted intense interest from optical scientists due to its unique optical force detection mechanism. Recent works on PiFM suggest that, combined with structured light illumination, the so-called system of structured light-induced force microscopy (SLiFM) can characterize conventionally elusive material properties with fidelity. In this review, we discuss the origin and state-of-art of SLiFM, including the following aspects: (a) the principle of PiFM and how it detects optical forces; (b) the fundamental physics of structured light beams; (c) the fundamental physics of structured light–structured matter interaction; (d) the relation between optical force and local electromagnetic fields. Lastly, we highlight the possible future industrial and academic applications of SLiFM in the characterization and manipulation of opto-magnetism, chirality, etc.
Funder
Science and Technology Innovation Commission of Shenzhen
National Natural Science Foundation of China
Fundamental Research Funds for the Central Universities
Program of Hubei Province of China
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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