Abstract
Abstract
The on-axis interference intensity patterns between a vortex beam and its conjugated beam can be used to measure the fractional topological charge of vortex beams. However, it is still challenging to efficiently recognize these intensity diagrams. On one hand, the difference of the patterns for adjacent modes with interval 0.1 is too subtle to be identified precisely. On the other hand, the interferograms are susceptible to undesirable experimental conditions such as the misalignment of the beams, the unequal arms of the interferometer and the deviation of splitting ratio of the beam splitters in the interferometer. Here, we propose a deep learning method to recognize these intensity diagrams with up to
97
%
accuracy. In particular, our method has reference values for deep learning model training when there is not adequate experimental data.
Funder
Zhang Dan-Wei and Zhang Ling-Feng
Research Fund of Guangdong-Hong Kong-Macao Joint Laboratory for Intelligent Micro-Nano Optoelectronic Technology
National Natural Science Foundation of China
Project of Department of Education of Guangdong Province
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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