Measurement and modelization of silica opal optical properties-Reference-Cited by-同舟云学术

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Measurement and modelization of silica opal optical properties

Published:2013-12-30 Issue:1 Volume:5 Page:015005
ISSN:2043-6262
Container-title:Advances in Natural Sciences: Nanoscience and Nanotechnology
language:
Short-container-title:Adv. Nat. Sci: Nanosci. Nanotechnol.

Author:

Avoine Amaury,Ngoc Hong Phan,Frederich Hugo,Aregahegn Kifle,Bénalloul Paul,Coolen Laurent,Schwob Catherine,Thu Nga Pham,Gallas Bruno,Maître Agnès

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,General Materials Science

Link

https://iopscience.iop.org/article/10.1088/2043-6262/5/1/015005/pdf

Reference21 articles.

1. Materials Aspects of Photonic Crystals

2. Opals: Status and Prospects

3. Photonic Band Structure of fcc Colloidal Crystals

4. Polarized light coupling to thin silica-air opal films grown by vertical deposition

5. Multiple Bragg diffraction in low-contrast photonic crystals based on synthetic opals

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical properties of an opal with a planar defect fabricated by inverse Schaefer and Langmuir–Blodgett techniques;Optical and Quantum Electronics;2014-05-22

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