Modification of the Terman method for determination of interface states in metal–insulator–semiconductor structures
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://iopscience.iop.org/article/10.1088/2399-6528/aa8cf8/pdf
Reference26 articles.
1. Determination of interface state density on Au/Ta2O5/n-InP structures by different methods
2. Extraction of interface state density at SiO2/SiC interfaces based on impedance measurements with different temperatures
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