Two-flat method for bi-dimensional measurement of absolute departure from the best sphere-Reference-Cited by-同舟云学术

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Two-flat method for bi-dimensional measurement of absolute departure from the best sphere

Published:1997-01 Issue:1 Volume:6 Page:117-126
ISSN:0963-9659
Container-title:Pure and Applied Optics: Journal of the European Optical Society Part A
language:
Short-container-title:Pure Appl. Opt.

Author:

Mercier R,Lamare M,Picart P,Marioge J P

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Reference13 articles.

1. Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen. I

2. Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen. II

3. Precise Measurement of Planeness

4. Ein Interferenzverfahren zur Absoluten Ebenheitsprüfung Längs Beliebiger Zentralschnitte

5. Establishing an Optical Flatness Standard

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Form Error Characterization of Reflective-Type Gratings;Key Engineering Materials;2012-11

2. Autonomous calibration method of the reference flat surface of an interferometer without using a standard flat surface;Applied Optics;2012-07-09

3. Absolute calibration of three reference flats based on an iterative algorithm: study and implementation;SPIE Proceedings;2011-09-22

4. Absolute interferometric measurement of flatness: application of different methods to test a 600 mm diameter reference flat;SPIE Proceedings;2007-06-18

5. A Data Conversion Technique for Accurate Interferometric Testing of Spherical Surfaces.;JSME International Journal Series C;2002

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